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Model solid approximation

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Electronic structure methods
Valence bond theory
Coulson–Fischer theory
Generalized valence bond
Modern valence bond theory
Molecular orbital theory
Hartree–Fock method
Semi-empirical quantum chemistry methods
Møller–Plesset perturbation theory
Configuration interaction
Coupled cluster
Multi-configurational self-consistent field
Quantum chemistry composite methods
Quantum Monte Carlo
Density functional theory
Time-dependent density functional theory
Thomas–Fermi model
Orbital-free density functional theory
Linearized augmented-plane-wave method
Projector augmented wave method
Electronic band structure
Nearly free electron model
Tight binding
Muffin-tin approximation
k·p perturbation theory
Empty lattice approximation
GW approximation
Korringa–Kohn–Rostoker method

The model solid approximation is a method used for determining the extrema of energy bands in semiconductors. The method was first proposed for silicon-germanium alloys by Chris G. Van de Walle and Richard M. Martin in 1986 and extended to several other semiconductor materials by Van de Walle in 1989. It has been used extensively for modelling semiconductor heterostructure devices such as quantum cascade lasers.

Although the electrostatic potential in a semiconductor crystal fluctuates on an atomic scale, the model solid approximation averages these fluctuations out to obtain a constant energy level for each material.

References

  1. Van de Walle, Chris G.; Martin, Richard M. (1986-10-15), "Theoretical calculations of heterojunction discontinuities in the Si/Ge system", Phys. Rev. B, 34 (8): 5621, Bibcode:1986PhRvB..34.5621V, doi:10.1103/PhysRevB.34.5621
  2. Van de Walle, Chris G. (1989-01-15), "Band lineups and deformation potentials in the model-solid theory", Phys. Rev. B, 39 (3): 1871, Bibcode:1989PhRvB..39.1871V, doi:10.1103/PhysRevB.39.1871
  3. Faist, Jérôme; Capasso, Federico; Sivco, Deborah L.; Hutchinson, Albert L.; Chu, Sung-Nee G.; Cho, Alfred Y. Cho (1998-02-09), "Short wavelength (λ~3.4 μm) quantum cascade laser based on strained compensated InGaAs/AlInAs", Appl. Phys. Lett., 72 (6): 680, Bibcode:1998ApPhL..72..680F, doi:10.1063/1.120843


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